The in Austin, Texas hits day three of four today Wednesday, August 6. The 20th Annual National Instruments Conference is an opportunity for those working in the fields of engineering and science to come together in the spirit of sharing information, inspiring innovation and exploring new technologies.
DMC has sent engineers from each of our Chicago, Boston, and Denver offices to present on topics ranging from automation, to battery management systems and vision inspection. Catch today’s presentation entitled given by , Project Engineer at DMC; , Technical Director at DMC;, Project Engineer at DMC; and , Sr. Software Development Manager at W.H. Leary Co., Inc.
The presentation will address the urgency of vision inspection performance in the age of fast-paced automation. Using case-studies and examples from recent projects, Jones, Brey, West and McCarty will offer advice and insight on effective, high-speed vision inspection. The team will also cover hardware selection, custom training and more.
Real-World Techniques in High-Speed Vision Inspection will be held Wednesday, August 6, 4:45pm-5:45pm in Room 17B.